- Scanning Electronic Microscope and the EDS
Type: Japan Electronic JSM-560LV Scanning Electronic Microscope and the USA Thermoelectric EDS.
Main information: The scanning electronic microscope, which magnification is from 18x to 30000x and the resolution is 3.0nm, is used for the research and analysis of the fractures, the relationship of fractures of the mental and the working conditions, using it we can give reasonability advises for the improvement of the material. Besides, the system is always used to research the relationship of the composition and the performance of the materials. The EDS抯 resolution is 130ev, and it can be used for the qualitative and the half quantitative analysis about the element from B4 to U92 in the trace area.
- Optical Microscope and Image Analysis System
Type: Germany Leica Microscope and SISI Mental Phase diagram Analysis software.
Main information: Optical Microscope magnification from 50x to 1000x, is used for the analysis of the material contractures, grain size, conclusions etc. And the Phase diagram software is used for the determination of the composition phase, the average grain size evaluation, the determination of content of nonmetallic inclusions of the steel, and the measurement of the thickness of decarburization layers.